专利名称：Automated inspection and processing
system
发明人：Bruce N. Nelson,Paul Slebodnick,Edward
John Lemieux,Matt Krupa,William Singleton
申请号：US10508850申请日：20030324
公开号：US20050151841A1公开日：20050714
专利附图：
摘要：An automated inspection system is provided wherein an inspection of a surfaceand the processing of inspection data acquired from the surface can be performed with
limited or no operator involvement and wherein a high level of consistency can be smaintained between each inspection and between each processing of inspection dataacross multiple inspections of the surface.
申请人：Bruce N. Nelson,Paul Slebodnick,Edward John Lemieux,Matt Krupa,WilliamSingleton
地址：West Newton MA US,Springfield VA US,Key West FL US,Key West FL US,NewtonMA US
国籍：US,US,US,US,US
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