External force detecting method and external force

专利名称：External force detecting method and

external force detecting device

发明人：Koyama, Mitsuaki,Mutoh, Takeru,Iwai, Hiroki申请号：EP12151091.1申请日：20120113公开号：EP2477035A1公开日：20120718

专利附图：

摘要：A technique capable of accurately and easily detecting external force applied toa piezoelectric plate is provided. A crystal plate 2 is cantilever-supported in a container 1.Excitation electrodes 31, 41 are formed on an upper face and lower face, respectively, for

example in a center portion of the crystal plate 2. On a front end portion of a lower faceside of the crystal plate 2, a movable electrode 5 connected via a lead-out electrode 42to the excitation electrode 41 is formed on the lower face side, and a fixed electrode 6 isprovided on a bottom portion of the container 1 to face this movable electrode 5. Theexcitation electrode 31 on the upper face side and the fixed electrode 6 are connected toan oscillation circuit 14. When the crystal plate 2 bends by external force applied,capacitance between the movable electrode 5 and fixed electrode 6 changes, and thiscapacitance change and a deformation of the crystal plate 2 are regarded as a change inoscillation frequency of the oscillation circuit 14. Further, an angle θ formed between adirection in which external force is applied and a direction of the movable electrode 5along a length direction of the crystal plate 2 before the external force is applied is setto 30° to 60°, preferably 40° to 50°, to perform measurement.

申请人：Nihon Dempa Kogyo Co., Ltd.

地址：Sasazuka NA Bldg., 1-50-1 Sasazuka, Shibuya-ku Tokyo 151-8569 JP

国籍：JP

代理机构：TBK

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