Apparatus for measuring thickness

专利名称：Apparatus for measuring thickness发明人：Gignoux, Dominique,Murray, Russell申请号：EP82108258.3申请日：19820908公开号：EP0075190B1公开日：190301

摘要：A thickness gauge of the kind consisting of a radiation source (10) producing abeam (12) aimed at a detector (14) whereby a material (20) to be gauged obstructs theradiation beam, so that the intensity of radiation received by the detector, and hence thedetector output (I) varies and said variation can be translated into a thickness

measurement (X). Standards (18) are used for calibration and computer means (16) ansmethods provide better measurements by using a function relating the thickness to thedetector output in a large range and independently of random inaccuracies of thestandards.

申请人：DATA MEASUREMENT CORPORATION

代理机构：JENSEN & SON

更多信息请下载全文后查看