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Method of forming a semiconductor layer

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专利名称:Method of forming a semiconductor layer发明人:Hunter J. Martinez,John J. Hackenberg,Jill

Hildreth,Ross E. Noble

申请号:US12275659申请日:20081121公开号:US07972922B2公开日:20110705

专利附图:

摘要:A method of forming a semiconductor layer, which in one embodiment is part ofa photodetector, includes forming a silicon shape, applying ozonated water, removingthe first oxide layer at a temperature below 600 degrees Celsius, and epitaxially growing

germanium. The silicon shape has a top surface that is exposed. The ozonated water isapplied to the top surface and causes formation of a first oxide layer on the top surface.The germanium is grown on the top surface.

申请人:Hunter J. Martinez,John J. Hackenberg,Jill Hildreth,Ross E. Noble

地址:Austin TX US,Austin TX US,Austin TX US,Austin TX US

国籍:US,US,US,US

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