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Method and apparatus for thermal conductivity meas

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专利名称:Method and apparatus for thermal

conductivity measurements

发明人:Marcus, Sanford M.,Reading, Michael申请号:EP94304425.5申请日:19940617公开号:EP0634649A3公开日:19950405

摘要:The present invention is a method and apparatus for measuring the thermalconductivity of materials using modulated differential scanning calorimetry (MDSC). TwoMDSC heat capacity measurements are made consecutively. One measurement is madeunder conditions which ensure obtaining a fairly accurate value for the heat capacity ofthe material. Another measurement is made under conditions such that the measuredeffective heat capacity differs from the accurate value of the heat capacity due to thermalconductivity effects. The thermal conductivity of the material is then calculated.

申请人:TA INSTRUMENTS, INC.

地址:109 Lukens Drive New Castle, Delaware 19720 US

国籍:US

代理机构:Rickard, Timothy Mark Adrian

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