专利名称：Test systems for wireless-communications
devices
发明人：GUANGHUA HUANG,GREGORY VAMBEKE申请号：AU8086901申请日：20010727公开号：AU8086901A公开日：20020213
摘要：A test probe for a high-frequency device having an electronic circuit with two ormore contact regions. The test probe comprises two or more signal probe tips. Eachsignal probe tip has a contact surface area for contacting one of the contact regions ofthe device. A ground probe has a ground contact surface with a surface area substantiallygreater than the contact surface area of the one signal probe tip for contacting anotherone of the contact regions of the electronic circuit. The ground probe is positionedbetween at least two of the signal probes.
申请人：HEI, INC.
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