X-ray inspection device

专利名称：X-ray inspection device

发明人：Hiromu Nishimura,Shingo Kondo,Kaname

Nishiue,Shinya Makino,Kotaro Kobayashi

申请号：US16750968申请日：20200123公开号：US11147149B2公开日：20211012

专利附图：

摘要：An X-ray inspection device is configured to prevent water from flowing intoareas of the X-ray inspection device during a washing operation. The X-ray inspectiondevice is provided with an X-ray emitter, a cooler, a cooler cover, and an opening/closing

member. The cooler cools the X-ray emitter. The cooler cover covers the cooler.Openings are formed in the cooler cover and, when open, provide interior-exterior airflow communication when the cooler is cooling the X-ray inspection device. Anopening/closing member is configured for movement between an open orientationopening the opening and a closed orientation closing the openings formed in the coolercover.

申请人：ISHIDA CO., LTD.

地址：Kyoto JP

国籍：JP

代理机构：Global IP Counselors, LLP

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