专利名称:Device and method for manufacturing
substrate
发明人:並木 計介,福島 誠,鍋谷 治申请号:JP2018059670申请日:20180327公开号:JP2019171492A公开日:20191010
专利附图:
摘要:Problem to be solved: to provide a substrate holding device capable ofsuppressing variation in polishing rate in the circumferential direction of the substrate.The substrate holding device 1 comprises a polishing head body 10, a dry ring 81
disposed below the polishing head body 10, and a retainer ring 40 fixed to the dry ring81.The driving ring 81 has an annular contact surface in contact with the retainer ring 40,and the plane surface in the circumferential direction of the contact surface is 4.6. Mu. Mor less.The flatness indicates the difference between the highest position of the contactsurface and the height at the lowest position.Diagram
申请人:株式会社荏原製作所
地址:東京都大田区羽田旭町11番1号
国籍:JP
代理人:廣澤 哲也,渡邉 勇
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