Circuit board testing apparatus and method

专利名称：Circuit board testing apparatus and method发明人：Tsuji, Yoshio, Nihon Densan Read Kabushiki

Kaisha,Yamada, Masayoshi

申请号：EP02003210.8申请日：20020219公开号：EP1233275B2公开日：20091209

摘要：A circuit board testing apparatus for testing continuity and/or short-circuit ofwirings formed on a circuit board, includes an electromagnetic wave irradiator whichirradiates first terminals of the wirings with an electromagnetic wave so that electronsare discharged from the first terminals by photoelectric effect. Discharged electrons aretrapped by an electrode which is electrically biased to have a higher potential than thatof the second terminals of the wirings, thereby causing an electric current to flowthrough the wirings via the electrode. Existence of open-circuit and/or short-circuit of thewirings is judged based on the current flowing the wirings.

申请人：NIHON DENSAN READ KABUSHIKI KA

地址：JP

国籍：JP

代理机构：HOFFMANN EITLE

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