ANALYZING DEVICE, AND ANALYZING APPARATUS AND ANAL

专利名称：ANALYZING DEVICE, AND ANALYZING

APPARATUS AND ANALYZING METHODUSING THE DEVICE

发明人：SAIKI, Hiroshi,TAGASHIRA,

Kouzou,SUGIMOTO, Hirofumi,WATANABE,Kenji,ISHIBASHI, Kenji,MIYATA, Takuji

申请号：EP09708335.6申请日：20090204公开号：EP2256501A1公开日：20101201

专利附图：

摘要：A measurement cell (40a) is formed so as to extend in a direction along which acentrifugal force is applied, and a capillary area (47a) to which a sample liquid is suckedby a capillary force is formed on one of the side walls of the measurement cell (40a), theside walls being arranged in a rotational direction. The capillary area (47a) extends fromthe outer periphery position to the inner periphery of the measurement cell (40a),thereby reducing the size of an analyzing device. Further, the sample liquid in themeasurement cell (40a) is sucked to the capillary area (47a) by slowing or stopping arotation, and then the rotation is accelerated to return the sample liquid in the capillaryarea (47a) to the measurement cell (40a). It is therefore possible to achieve a sufficientagitating effect and conduct measurement with a small quantity of sample liquid.

申请人：Panasonic Corporation

地址：1006, Oaza Kadoma Kadoma-shi Osaka 571-8501 JP

国籍：JP

代理机构：Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät

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