Testing apparatus for testing perpendicularity

专利名称：Testing apparatus for testing

perpendicularity

发明人：Bing-Jun Zhang申请号：US12205132申请日：20080905公开号：US07779551B2公开日：20100824

专利附图：

摘要：A testing apparatus for testing perpendicularity of an end surface of aworkpiece is disclosed. The testing apparatus includes an electrically conductive firstreference piece defining two guide holes, and two testing units. The testing units are

slidably engaged in the guide holes, so as to form two testing circuits. At a normal state,each testing circuit is closed, and each testing unit extends out of the guide hole for adistance, wherein the distance corresponds to an allowable perpendicularity tolerance.Each testing unit can be pushed to retract back to the guide holes by the end of theworkpiece to cause the testing circuit to be opened. The opened state or closed state ofeach of the testing circuits will help show the status of the perpendicularity of the endsurface of the workpiece.

申请人：Bing-Jun Zhang

地址：Shenzhen CN

国籍：CN

代理人：Clifford O. Chi

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